Roughness Effect Publications

Thin Film Roughness Effect Publications

M. Li, Y.-P. Zhao, G.-C. Wang and H.-G. Min, “Effect of surface roughness on magnetization reversal of Co films on plasma-etched Si(100) substrates,” J. Appl. Phys. 83, 6287 (1998).
Y.-P. Zhao, G. Palasantzas, G.-C. Wang, and J. Th. M. De Hosson, “Surface/interface roughness induced demagnetizing effect in thin magnetic films,” Phys. Rev. B 60, 1216 (1999).
Y.-P. Zhao, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, “Surface roughness effect on capacitance and leakage current of an insulating film,” Phys. Rev. B 60, 9157 (1999).
G. Palasantzas, Y.-P. Zhao, G.-C. Wang, and J. Th. M. De Hosson, “Roughness effects on magnetic properties of thin films,” Physica B 283, 199 (2000).
G. Palasantzas, Y.-P. Zhao, G.-C. Wang, T.-M. Lu, J. Barnas and J. Th. M. De Hosson, “Electrical conductivity and thin films growth dynamics,” Phys. Rev. B 61, 11109 (2000).
M. Li, Y.-P. Zhao, and G.-C. Wang, “In-situ measurement of thickness dependence of electrical resistance of ultrathin Co films on SiO2/Si(111) substrate,” J. Vac. Sci. Tech. A 18, 2992 (2000).
Y.-P. Zhao, R. M. Gamache, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, “Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity,” J. Appl. Phys. 89, 1325 (2001).
H.-D. Liu, Y.-P. Zhao, G. Ramanath, S. P. Murarka, and G.-C. Wang, “Thickness dependent electrical resistivity of ultrathin (<40 nm) Cu films,” Thin Solid Films 384, 151 (2001).
Y.-P. Zhao, B. Q. Wei, P. M. Ajayan, G. Ramanath, T.-M. Lu, G.-C. Wang, A. Rubio and S. Roche, “Frequency-dependent electrical transport in carbon nanotubes,” Phys. Rev. B 64, 201402(R) (2001).