Thin Film Growth - Experiment

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• H.-N. Yang, Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, “Noise-induced roughening evolution of amorphous Si films grown by thermal evaporation,” Phys. Rev. Lett. 76, 3774 (1996).

• Y.-P. Zhao, J. T. Drotar, G.-C. Wang, and T.-M. Lu, “Roughening in plasma etch fronts of Si(100),” Phys. Rev. Lett. 82, 4882 (1999).

• Y.-P. Zhao, J. B. Fortin, G. Bonvallet, G.-C. Wang, and T.-M. Lu, “Kinetic roughening in vapor deposition polymerization of linear-chain polymer films,” Phys. Rev. Lett. 85, 3229 (2000).

• Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, Reply to Das Sarma's Comment, Phys. Rev. Lett. 86, 2697 (2001).

• T. Karabacak, Y.-P. Zhao, Jason T. Drotar, G.-C. Wang, and T.-M. Lu, “Growth-front roughening in amorphous silicon films by sputtering,” Phys. Rev. B 64, 085323 (2001).

• T. Karabacak, Y.-P. Zhao, Jason T. Drotar, G.-C. Wang, and T.-M. Lu, “Kinetic roughening in silicon nitride films growth by PECVD,” Phys. Rev. B 66, 075329 (2002).

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Thin Film Growth - Theory

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• H.-N. Yang, Y.-P. Zhao, A. Chan, G.-C. Wang, and T.-M. Lu, “Sampling-induced hidden cycles in correlated random rough surface,” Phys. Rev. B 56, 4224 (1997).

• Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, “Numerical analysis of the noisy Kuramoto-Sivashisky equation in 2+1 dimensions,” Phys. Rev. E 59, 177 (1999).

• Y.-P. Zhao, A.R. Hopper, G.-C. Wang, and T.-M. Lu, “Monte Carlo simulation of the initial growth stage in vapor deposition polymerization,” Phys. Rev. E 60, 4310 (1999).

• Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, “Mechanisms for plasma and reactive ion etch-front roughening,” Phys. Rev. B 61, 3012 (2000).

• Jason T. Drotar, Y.-P. Zhao, T.-M. Lu and G.-C. Wang, “Surface roughening in shadowing growth and etching in 2+1 dimensions,” Phys. Rev. B 62, 2118 (2000).

• Jason T. Drotar, Y.-P. Zhao, T.-M. Lu, and G.-C. Wang, “Surface-roughening in low-pressure chemical vapor deposition,” Phys. Rev. B 64, 125411 (2001).

• Y.-P. Zhao, Jason T. Drotar, T.-M. Lu, and G.-C. Wang, “Morphology transition during low pressure chemical vapor deposition,” Phys. Rev. Lett. 87, 136102 (2001).

• Wade Bowie and Y.-P. Zhao, “Monte Carlo simulation of vapor deposition polymerization,” Surf. Sci. Lett. 563, L245–L250 (2004).

• S. Tangirala, D. P. Landau, and Y.-P. Zhao, ‘‘Dynamic scaling study of vapor deposition polymerization: a Monte Carlo approach,” Phys. Rev. E 81, 011605 (2010).

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Scattering from Rough Surfaces - Experiment

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• Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, “Diffraction from non-Gaussian rough surfaces,” Phys. Rev. B 55, 13938 (1997).

• T.-M. Lu, G.-C. Wang, and Y.-P. Zhao, “Beyond intensity oscillation,” Surface Science Review and Letter 5, 899 (1998).

• Y.-P. Zhao, H.-N. Yang, G.-C. Wang, and T.-M. Lu, “Diffraction from diffusion barrier induced mound structures in epitaxial growth fronts,” Phys. Rev. B 57, 1922 (1998).

• Y.-P. Zhao, G.-C. Wang, and T.-M. Lu, “Diffraction from anisotropic random rough surfaces,” Phys. Rev. B 58, 7300 (1998).

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Scattering from Rough Surfaces - Experiment

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• Y. P. Zhao, H.-N. Yang, G.-C. Wang, and T.-M. Lu, “Extraction of real-space correlation function of a rough surface by light scattering using diode array detectors,” Appl. Phys. Lett. 68, 3063 (1996).

• Y.-P. Zhao, Y.-J. Wu, H.-N. Yang, G.-C. Wang, and T.-M. Lu, “In situ real-time study of chemical etching process of Si(100) using light scattering,” Appl. Phys. Lett. 69, 221 (1996).

• Y.-P. Zhao, C.-F. Cheng, G.-C. Wang, and T.-M. Lu, “Power law behavior in diffraction from fractal surfaces,” Surf. Sci. Lett. 409, L703 (1998).

• Y.-P. Zhao, Irene Wu, C.-F. Cheng, Ueyn Block, G.-C. Wang, and T.-M. Lu, “Characterization of random rough surfaces by in-plane light scattering,” J. Appl. Phys. 84, 2571 (1998).

• Y.-P. Zhao, C.-F. Cheng, G.-C. Wang, and T.-M. Lu, “Characterization of pitting corrosion in aluminum films by light scattering,” Appl. Phys. Lett. 73, 2432 (1998).

• T. Karabacak, Y.-P. Zhao, M. Stowe, B. Quayle, T.-M. Lu, and G.-C. Wang, “Large angle in-plane light scattering from rough surfaces,” Appl. Opt. 39, 4658 (2000).

• T. Karabacak, Y.-P. Zhao, T. Liew, T.-M. Lu, and G.-C. Wang, “Anisotropic scaling of hard disk surface structures,” J. Appl. Phys. 88, 3361 (2000).

• Jason T. Drotar, B. Q. Wei, Y.-P. Zhao, G. Ramanath , P. M. Ajayan, T.-M. Lu, and G.-C. Wang, “Reflection high-energy electron diffraction from carbon nanotubes,” Phys. Rev. B. 64, 125417 (2001).

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Roughness Effect on Electric Property

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• Y.-P. Zhao, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, “Surface roughness effect on capacitance and leakage current of an insulating film,” Phys. Rev. B 60, 9157 (1999).

• M. Li, Y.-P. Zhao, and G.-C. Wang, “In-situ measurement of thickness dependence of electrical resistance of ultrathin Co films on SiO2/Si(111) substrate,” J. Vac. Sci. Tech. A 18, 2992 (2000).

• G. Palasantzas, Y.-P. Zhao, G.-C. Wang, T.-M. Lu, J. Barnas, and J. Th. M. De Hosson, “Electrical conductivity and thin films growth dynamics,” Phys. Rev. B 61, 11109 (2000).

• H.-D. Liu, Y.-P. Zhao, G. Ramanath , S. P. Murarka, and G.-C. Wang, “In-situ measurement of thickness dependent of electrical resistance of ultrathin Cu films on thick SiO2/Si(100) substrate,” Thin Solid Films 384, 151–156 (2001).

• Y.-P. Zhao, B. Q. Wei, P. M. Ajayan, G. Ramanath , T.-M. Lu, G.-C. Wang, A. Rubio, and S. Roche, “Frequency-dependent electrical transport in carbon nanotubes,” Phys. Rev. B 64, 201402(R) (2001).

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Roughness Effect on Magnetic Property

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• M. Li, Y.-P. Zhao, G.-C. Wang and H.-G. Min, “Effect of surface roughness on magnetization reversal of Co films on plasma-etched Si(100) substrates,” J. Appl. Phys. 83, 6287 (1998).

• Y.-P. Zhao, G. Palasantzas, G.-C. Wang, and J. Th. M. De Hosson, “Surface/interface roughness induced demagnetizing effect in thin magnetic films,” Phys. Rev. B 60, 1216 (1999).

• G. Palasantzas, Y.-P. Zhao, G.-C. Wang, and J. Th. M. De Hosson, “Roughness effects on magnetic properties of thin films,” Physica B 283, 199 (2000).

• Y.-P. Zhao, R. M. Gamache, G.-C. Wang, T.-M. Lu, G. Palasantzas, and J. Th. M. De Hosson, “Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity,” J. Appl. Phys. 89, 1325 (2001).